Atomic scale characterization and first-principles studies of Si3N4 interfaces/ Weronica Walkosz.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	QC173.4.I57 .W34 2011 (Browse shelf(Opens below))	Available		1000278294

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Previous	QC173.4.I57 .C42 2005 Characterization and control of interfaces for high quality advanced materials : proceedings of the International Conference on the Characterization and Control of Interfaces for High Quality Advanced Materials (ICCCI 2003), Kurashiki, Jap.	QC173.4.I57 .P37 2011 v.18 Interface science and composites /	QC173.4.I57 .S87 2008 Structure and dynamics of membranous interfaces /	QC173.4.I57 .W34 2011 Atomic scale characterization and first-principles studies of Si3N4 interfaces/	QC173.4.I57 H69 1997 Interfaces in materials : atomic structure, thermodynamics and kinetics of solid-vapor, solid-liquid and solid-solid interfaces /	QC173.4.L55 .J34 2006 One- and two-dimensional fluids : physical properties of smectic, lamellar and columnar liquid crystals /	QC173.4.M48 .A46 2005 Structure and properties of atomic nanoclusters /	Next

Includes bibliographical references and index

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