Oxide reliability : a summary of silicon oxide wearout, breakdown and reliability / editor, D. J. Dumin.

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TextSeries: Publisher: River Edge, NJ : World Scientific, 2002Description: ix, 270 pages : illustrations ; 26 cmContent type:

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Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7871.99.M44 .O94 2002 (Browse shelf(Opens below))	Available		1000191101

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