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	1.	Defect-oriented testing for nano-metric CMOS VLSI circuits / edited by Manoj Sachdev, Jose Pineda de Gyvez. by Sachdev, Manoj Pineda de Gyvez, Jose Series: Edition: 2nd ed. Material type: Text; Format: print Publisher: Boston, MA : Springer, 2007 Availability: Items available for loan: PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH (1)Call number: TK7871.99.M44 .D43 2007. Place hold Place recall Add to cart (remove)
	2.	CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / Andrei Pavlov, Manoj Sachdev by Pavlov, Andrei Sachdev, Manoj Series: Material type: Text; Format: print Publication details: Dordrecht : Springer, 2008 Availability: Items available for loan: PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH (1)Call number: TK7871.99.M44 .P38 2008. Place hold Place recall Add to cart (remove)

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