Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman.

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TextPublisher: New York : Society of Manufacturing Engineers, 2005Description: x, 206 pages : illustrations ; 24 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	HD47.3 .S27 2005 (Browse shelf(Opens below))	Available		1000201198

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