Lock-in thermography : basics and use for functional diagnostics of electronic components / O. Breitenstein, M. Langenkamp.

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TextSeries: Publisher: New York : Springer, 2003Description: viii, 193 pages : illustrations (some color) ; 24 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7870.25 .B73 2003 (Browse shelf(Opens below))	Available		1000072386

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