CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / Andrei Pavlov, Manoj Sachdev

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Material type: Text

TextSeries: Publication details: Dordrecht : Springer, 2008Description: xvi, 193 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7871.99.M44 .P38 2008 (Browse shelf(Opens below))	Available		10000260303

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